%A Hien, Vu Thu %A Minh Phuong, Nguyen Thi %D 2020 %T Microstructure and Electrical Properties of Low-temperature Solution-processed Sol-gel KNN Thin Films %K %X We report on an environmentally friendly and versatile chemical solution deposition route to K 0.5 Na 0.5 NbO 3 (KNN) thin films. The excess amounts of K and Na in KNN precursor solutions was found to be strong influence on perovskite KNN single-phase thin films. It was revealed from Raman spectroscopic analysis data that a change in scattering mode was observed for the KNN thin films fabricated under various processing conditions. This change was due to the chemical composition fluctuation of K and Na in the KNN thin films during heat treatment. The leakage current and ferroelectric properties of the thin films were strongly affected by the excess amounts of K and Na as well. KNN thin films with 20 mol% excess K and Na exhibited a leaky ferroelectric polarization–electric field (P–E) hysteresis. Leakage current density of the film was 3.85´10 -8 A/cm 2 at applied field of -60 kV/cm. %U https://js.vnu.edu.vn/MaP/article/view/4460 %J VNU Journal of Science: Mathematics - Physics %0 Journal Article %R 10.25073/2588-1124/vnumap.4460 %V 36 %N 3 %@ 2588-1124 %8 2020-08-21