TY - JOUR AU - Hien, Vu Thu AU - Minh Phuong, Nguyen Thi PY - 2020 TI - Microstructure and Electrical Properties of Low-temperature Solution-processed Sol-gel KNN Thin Films JF - VNU Journal of Science: Mathematics - Physics; Vol 36 No 3 DO - 10.25073/2588-1124/vnumap.4460 KW - N2 - We report on an environmentally friendly and versatile chemical solution deposition route to K 0.5 Na 0.5 NbO 3 (KNN) thin films. The excess amounts of K and Na in KNN precursor solutions was found to be strong influence on perovskite KNN single-phase thin films. It was revealed from Raman spectroscopic analysis data that a change in scattering mode was observed for the KNN thin films fabricated under various processing conditions. This change was due to the chemical composition fluctuation of K and Na in the KNN thin films during heat treatment. The leakage current and ferroelectric properties of the thin films were strongly affected by the excess amounts of K and Na as well. KNN thin films with 20 mol% excess K and Na exhibited a leaky ferroelectric polarization–electric field (P–E) hysteresis. Leakage current density of the film was 3.85´10 -8 A/cm 2 at applied field of -60 kV/cm. UR - https://js.vnu.edu.vn/MaP/article/view/4460