THI THUY, Nguyen; 						DINH LAM, Nguyen; 						SHIN-ICHIRO, Kuroki.
 Void-Defect Location Control of Laser-Crystallized  Silicon Thin Films with Hole-Pattern.
<strong>VNU Journal of Science: Mathematics - Physics</strong>, [S.l.], v. 38, n. 4, dec. 2022.
ISSN 2588-1124.
Available at: &lt;<a href="https://js.vnu.edu.vn/MaP/article/view/4742" target="_new">https://js.vnu.edu.vn/MaP/article/view/4742</a>&gt;. Date accessed: 22 nov. 2024.
doi: <a href="https://doi.org/10.25073/2588-1124/vnumap.4742">https://doi.org/10.25073/2588-1124/vnumap.4742</a>.