Thi Thuy, N., 		Dinh Lam, N., & 		Shin-Ichiro, K.
(2022).
 Void-Defect Location Control of Laser-Crystallized  Silicon Thin Films with Hole-Pattern.
<em>VNU Journal Of Science: Mathematics - Physics, 38</em>(4).
doi:10.25073/2588-1124/vnumap.4742