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 Investigation of zinc oxide thin film by spectroscopic ellipsometry.
<strong>VNU Journal of Science: Mathematics - Physics</strong>, [S.l.], v. 24, n. 1, mar. 2008.
ISSN 2588-1124.
Available at: &lt;<a href="https://js.vnu.edu.vn/MaP/article/view/3481" target="_new">https://js.vnu.edu.vn/MaP/article/view/3481</a>&gt;. Date accessed: 14 may 2024.