Investigation of zinc oxide thin film by spectroscopic ellipsometry

Nguyen Nam Dinh; Tran Quang Trung; Le Khac Binh; Nguyen Dang Khoa; Vo Thi Mai Thuan

Nguyen Nam Dinh, Tran Quang Trung, Le Khac Binh, Nguyen Dang Khoa, Vo Thi Mai Thuan

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Published Mar 15, 2008

How to Cite

DINH, Nguyen Nam et al. Investigation of zinc oxide thin film by spectroscopic ellipsometry. VNU Journal of Science: Mathematics - Physics, [S.l.], v. 24, n. 1, mar. 2008. ISSN 2588-1124. Available at: <https://js.vnu.edu.vn/MaP/article/view/3481>. Date accessed: 29 apr. 2024.

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Vol 24 No 1

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