OYINDENYIFA NELSON, Nenuwe; 						OGHOGHO, Omagbemı.
 DFT based Investigation of Structural,  Thermodynamic, Mechanical and Electronic Properties  of RuVZ (Z: As, Bi, Sb) Half-Heusler Semiconductors.
<strong>VNU Journal of Science: Mathematics - Physics</strong>, [S.l.], v. 38, n. 3, sep. 2022.
ISSN 2588-1124.
Available at: &lt;<a href="https://js.vnu.edu.vn/MaP/article/view/4705" target="_new">https://js.vnu.edu.vn/MaP/article/view/4705</a>&gt;. Date accessed: 22 nov. 2024.
doi: <a href="https://doi.org/10.25073/2588-1124/vnumap.4705">https://doi.org/10.25073/2588-1124/vnumap.4705</a>.