Synthesis and characterization of indium nanoparticles
Main Article Content
Abstract
Abstract. In this paper, we present the results on synthesis of indium nanoparticles by the reduction of indium chloride in a solution of sodium borohydride (NaBH4). The indium nanoparticles were characterized by X-ray diffraction, transmission electron microscopy (TEM) and UV-visible spectroscopy. The analysis of X-ray diffraction (XRD) indicates that the indium nanoparticles possess a tetragonal crystal structure. The TEM images demonstrate that the nanoparticles with a size about 100 nm were agglomerate from many smaller particles. Effect of some technology conditions on the formation of the indium nanoparticles was studied.
References
[1] Luis M Liz-Marzán, Materialstoday 7, 26 (2004).
[2] Christof M. Niemeyer, Angew. Chem. Int. Ed. 40, 4128 (2001).
[3] Susie Eustis and Mostafa A. El-Sayed, Chem.Soc. Rev. 35, 209 (2005).
[4] Jose Luis Elechiguerra, Justin L Burt, Jose R Morones, Alejandra Camacho-Bragado, Xiaoxia Gao, Humberto H Lara and Miguel Jose Yacaman, Journal of Nanobiotechnology 3,6 (2005).
[5] E. Cattaruzza, F. Gonella, G. Mattei, F. Mazzoldi, D. Gatteschi, C. Sangregorio, M. Falconieri, G. Salvetti, G. Battaglin, Appl. Phys. Lett. 73, 1176 (1998).
[6] D. Ila, E.K. Williams, S. Sarkisov, C.C. Smith, D.B. Poker, D.K. Hensley, Nucl. Instrum. Methods Phys. Res. B 141, 289 (1998).
[7] W.Wang, G. Yang, Z. Chen, Y. Zhou, H. Lu, G. Yang, J. Appl. Phys. 92, 7242 (2002).
[8] M. Falconieri, G. Salvetti, E. Cattaruza, F. Gonella, G. Mattei, P. Mazzoldi, M. Piovesan, G. Battaglin, R. Polloni, Appl. Phys. Lett. 73, 288 (1998).
[9] Nam Hawn Chou and Xianglin Ke, Peter Schiffer and Raymond E Schaak, J. American Chemical Society 130, 8140 (2008).
[10] T. Junno, M.H. Magnusson, S.B. Carlsspn, K. Deppert, J.O. Malm, M. Montelius, L. Samuelson, Microelectron. Eng. 47, 179 (1999).
[11] J. Wang, G. Liu, Q. Zhu, Anal. Chem. 75, 6218 (2003).
[12] J.M. Nedeljkovic, O.I. Micic, S.P. Ahrenkiel, A. Miedaner, A.J. Nozik, J. Am. Chem. Soc. 126 2632 (2004).
[13] Y. Zhang, H. Ago, J. Liu, M. Yumura, K. Uchida, S. Ohshima, S. Iijima, J. Zhu, X. Zhang, J. Cryst. Growth 264, 363 (2004).
[14] I. Rodriguez-Sanchez, M.C. Blanco, M.A. Lopez-Quintela, J. Phys. Chem., B 104, 9683 (2000).
[15] R.A. Ganeev, A.I. Ryasnyanskiy, U. Chakravarty, P.A. Naik, H. Srivastava, M.K. Tiwari, P.D. Gupta, Appl. Phys. B 86, 337 (2007).
[16] Zhiwei Li, Xiaojun Tao, Yaming Cheng, Zhishen Wu, Zhijun Zhang, Hongxin Dang, Materials Science and Engineering A 407, 7 (2005).
[17] B.E. Warren, X-ray Diffraction, Dover publications, Inc., New York, 1990, p. 253.
[18] Prashant Singh, Sunil Kamar, Anju Katyal, Rashmi Kalra, Ramesh Chandra, Materials Letters 62, 4664 (2008).
[19] Yanlao Zhao, Zhijun Zhang and Hongxin Dang, J. Phys. Chem., B 107, 7574 (2003).
[20] S.G. Chen, C.H. Li, W.H. Xiong, L.M. Liu, H. Wang, Mater. Lett. 58, 294 (2004).
[2] Christof M. Niemeyer, Angew. Chem. Int. Ed. 40, 4128 (2001).
[3] Susie Eustis and Mostafa A. El-Sayed, Chem.Soc. Rev. 35, 209 (2005).
[4] Jose Luis Elechiguerra, Justin L Burt, Jose R Morones, Alejandra Camacho-Bragado, Xiaoxia Gao, Humberto H Lara and Miguel Jose Yacaman, Journal of Nanobiotechnology 3,6 (2005).
[5] E. Cattaruzza, F. Gonella, G. Mattei, F. Mazzoldi, D. Gatteschi, C. Sangregorio, M. Falconieri, G. Salvetti, G. Battaglin, Appl. Phys. Lett. 73, 1176 (1998).
[6] D. Ila, E.K. Williams, S. Sarkisov, C.C. Smith, D.B. Poker, D.K. Hensley, Nucl. Instrum. Methods Phys. Res. B 141, 289 (1998).
[7] W.Wang, G. Yang, Z. Chen, Y. Zhou, H. Lu, G. Yang, J. Appl. Phys. 92, 7242 (2002).
[8] M. Falconieri, G. Salvetti, E. Cattaruza, F. Gonella, G. Mattei, P. Mazzoldi, M. Piovesan, G. Battaglin, R. Polloni, Appl. Phys. Lett. 73, 288 (1998).
[9] Nam Hawn Chou and Xianglin Ke, Peter Schiffer and Raymond E Schaak, J. American Chemical Society 130, 8140 (2008).
[10] T. Junno, M.H. Magnusson, S.B. Carlsspn, K. Deppert, J.O. Malm, M. Montelius, L. Samuelson, Microelectron. Eng. 47, 179 (1999).
[11] J. Wang, G. Liu, Q. Zhu, Anal. Chem. 75, 6218 (2003).
[12] J.M. Nedeljkovic, O.I. Micic, S.P. Ahrenkiel, A. Miedaner, A.J. Nozik, J. Am. Chem. Soc. 126 2632 (2004).
[13] Y. Zhang, H. Ago, J. Liu, M. Yumura, K. Uchida, S. Ohshima, S. Iijima, J. Zhu, X. Zhang, J. Cryst. Growth 264, 363 (2004).
[14] I. Rodriguez-Sanchez, M.C. Blanco, M.A. Lopez-Quintela, J. Phys. Chem., B 104, 9683 (2000).
[15] R.A. Ganeev, A.I. Ryasnyanskiy, U. Chakravarty, P.A. Naik, H. Srivastava, M.K. Tiwari, P.D. Gupta, Appl. Phys. B 86, 337 (2007).
[16] Zhiwei Li, Xiaojun Tao, Yaming Cheng, Zhishen Wu, Zhijun Zhang, Hongxin Dang, Materials Science and Engineering A 407, 7 (2005).
[17] B.E. Warren, X-ray Diffraction, Dover publications, Inc., New York, 1990, p. 253.
[18] Prashant Singh, Sunil Kamar, Anju Katyal, Rashmi Kalra, Ramesh Chandra, Materials Letters 62, 4664 (2008).
[19] Yanlao Zhao, Zhijun Zhang and Hongxin Dang, J. Phys. Chem., B 107, 7574 (2003).
[20] S.G. Chen, C.H. Li, W.H. Xiong, L.M. Liu, H. Wang, Mater. Lett. 58, 294 (2004).