Tran Thi Ha, Nguyen Thi Huyen Trang, Bach Thanh Cong, Nguyen Thi Dieu Thu, Nguyen Thanh Binh, Nguyen Viet Tuyen, Pham Nguyen Hai

Main Article Content

Abstract

We report a facile process to fabricate cuprous thin films by thermal oxidation of copper substrates. Structure and phase identification were studied by X-ray diffraction measurement and Raman spectroscopy. Scanning electron microscopy was utilized to study surface morphology of the as-fabricated thin films and optical properties of the samples were investigated by diffused reflectance spectroscopy. The study shows that cuprous thin films could be obtained by controlling annealing temperature in the region of 200-300 oC.

Keywords: Copper oxide, thin films, thermal oxidation, Raman

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