Evaluation of Thick Target PIXE Analysis in the 5SDH-2 Pelletron Accelerator Facility at VNU University of Science
Main Article Content
Abstract
This paper presents the evaluation of the Thick Target Particle Induced X-rays Emission (TTPIXE) technique using standard samples. The element-dependent standardization factor, H, as a function of X-ray energies is calibrated using standard sample NIST-611 and validated with two standard samples: IAEA-Soil7 and NIES-Pepperbush. The obtained results are in good agreement with the reference data.
Keywords:
PIXE, thick target, standard sample, calibration, 5SDH-2 pelletron.
References
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[9] L. H. Khiem, N. T. Nghia, V. H. Phong, B. V. Loat, Proton Induced X-ray Emission (PIXE) Analysis on Thick Samples at HUS 5SDH-2 Tandem Accelerator System, Comm. in Phys., Vol. 24, No. 3S2, 2014,
pp. 1-7, https://doi.org/10.15625/0868-3166/24/3S2/5013.
[10] National Institute of Standards and Technology, NIST-611 Sample,
https://www-s.nist.gov/srmors/certificates/611.pdf/, 2012 (accessed on: September 9th, 2020).
[11] L. Pszonicki, A. N. Hanna, O. Suschny, Report on the Intercomparison Run IAEA/Soil-7 of the Determination of Trace elements in Soil, IAEA Vienna, Australia, 1984.
[12] K. Okamoto, Preparation, Analysis and Certification of Pepperbush Standard Reference Material, NIES Research Report, 1980, pp.1-6.
[13] S. Gama, M. Volfinger, C. Ramboz, O. Rouer, Accuracy of PIXE Analyses Using a Funny Filter, Nucl. Instr. and Meth. B, Vol. 181, 2001, pp. 150-156, https://doi.org/10.1016/S0168-583X(01)00350-0.
[14] J. L. Campbell, N. I. Boyd, N. Grassi, P. Bonnick, J. A. Maxwell., The Guelph PIXE Software Package IV. Nucl. Instr. and Meth. B, Vol. 268, 2010, pp. 3356-3363, https://doi.org/10.1016/j.nimb.2010.07.012.
[2] G. Lagarde, J. Cailleret, C.Heitz, Quantitative Analysis of Thick Targets Containing Light Elements by PIXE, Nucl. Instr. and Meth, Vol. 205, 1983, pp. 545-553, https://doi.org/10.1016/0167-5087(83)90022-4.
[3] S. A. E. Johansson, J. L. Campbell, PIXE: A Novel Technique for Elemental Analysis, John Wiley, Chichester, U.K, 1988.
[4] S. Ali, J. Zeb, M. Haneef, A. M. Naeem, J. Akbar, Standardization of Proton-induced X-ray Emission Technique for Analysis of Thick Samples, Chin. Phys. Vol. 24, No. 9, 2015, https://doi.org/ 10.1088/1674-1056/24/9/090601.
[5] J. L. Campbell, J. A. Cookson, PIXE Analysis of Thick Targets, Nucl. Instr. and Meth. B, Vol. 3, 1984,
pp. 185-197, https://doi.org/10.1016/0168-583x(84)90361-6.
[6] J. L. Campbell, J. A. Cookson, H. Paul, Uncertainties in Thick-Target PIXE Analysis. Nucl. Instr and Meth,
Vol. 212, 1983, pp. 427-439, https://doi.org/10.1016/0167-5087(83)90725-1.
[7] D. D. Cohen, E. Clayton, Ion Induced X-ray Emission, in: J. R. Bird, J. S. Williams (Eds.), Ion Beams for Materials Analysis, Academic Press Australia, Australia, 1989, pp. 209-260.
[8] J. L. Campbell, A. Perujo, W. J. Teesdale, J. A. Maxwell, Analysis of Thick Targets by Proton-Induced X-ray Emission, Scanning Microscopy, Vol. 1, No. 4, 1987, pp. 1631-1640. Available at https://digitalcommons.usu.edu/microscopy/vol1/iss4/14.
[9] L. H. Khiem, N. T. Nghia, V. H. Phong, B. V. Loat, Proton Induced X-ray Emission (PIXE) Analysis on Thick Samples at HUS 5SDH-2 Tandem Accelerator System, Comm. in Phys., Vol. 24, No. 3S2, 2014,
pp. 1-7, https://doi.org/10.15625/0868-3166/24/3S2/5013.
[10] National Institute of Standards and Technology, NIST-611 Sample,
https://www-s.nist.gov/srmors/certificates/611.pdf/, 2012 (accessed on: September 9th, 2020).
[11] L. Pszonicki, A. N. Hanna, O. Suschny, Report on the Intercomparison Run IAEA/Soil-7 of the Determination of Trace elements in Soil, IAEA Vienna, Australia, 1984.
[12] K. Okamoto, Preparation, Analysis and Certification of Pepperbush Standard Reference Material, NIES Research Report, 1980, pp.1-6.
[13] S. Gama, M. Volfinger, C. Ramboz, O. Rouer, Accuracy of PIXE Analyses Using a Funny Filter, Nucl. Instr. and Meth. B, Vol. 181, 2001, pp. 150-156, https://doi.org/10.1016/S0168-583X(01)00350-0.
[14] J. L. Campbell, N. I. Boyd, N. Grassi, P. Bonnick, J. A. Maxwell., The Guelph PIXE Software Package IV. Nucl. Instr. and Meth. B, Vol. 268, 2010, pp. 3356-3363, https://doi.org/10.1016/j.nimb.2010.07.012.